IJS KOLOKVIJ, 11. 6. 2008, dr. Alexandre Gloter

[Andreja Berglez]

Vabim vas na 21. predavanje iz sklopa "Kolokviji na IJS" v letu 2007/08, ki
bo v sredo, 11. junija 2008, ob 13:00 uri v Veliki predavalnici Instituta
>Jožef Stefan< na Jamovi cesti 39 v Ljubljani. Napovednik predavanja najdete
tudi na naslovu http://www.ijs.si/ijsw/Koledar_prireditev, posnetke
preteklih predavanj pa na http://videolectures.net/kolokviji_ijs. 

~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
dr. Alexandre Gloter 

CNRS - University of Orsay, Francija

Presevna elektronska mikroskopija za karakterizacijo nanomaterialov, kje so
njene meje?

V prvem delu bom na kratko predstavil princip fokusiranja elektronskega
žarka z magnetnim poljem ter na splošno način delovanja presevnega
elektronskega mikroskopa. Predstavil bom tudi zadnje razvojne dosežke pri
razvoju eksperimentalne tehnike, kot je na primer korekcija sferične
aberacije elektronskih leč in vpliv le te na končno atomsko resolucijo. V
nadaljevanju bom pokazal uporabnost presevne elektronske mikroskopije pri
slikanju nanostruktur (od industrijsko zanimivih večplastnih strukutr do
nanodelcev v organski matrici) ter pri reševanju kristalne strukture ali pa
strukture okoli napak (na primer topološko opisovanje napak
funkcionaliziranih nanocevk). Na koncu se bom dotaknil še nekaterih
aktualnih raziskav okdsidacijskih stanj nanodelcev oksidov prehodnih kovin
ter plazmonskih lastnosti kovinskih skupkov. 

Predavanje bo v angleščini.
Lepo vabljeni!

 

 

 

 

 

We would like to invite you to 21st lecture of the "Kolokvij na IJS" in the
school year 2007/08. The lecture will be held on Wednesday, June 11, 2008,
at 1 pm at JSI main lecture hall, Jamova 39, Ljubljana. The abstract of the
lecture can be found on website:
<http://www.ijs.si/ijsw/Koledar_prireditev>
http://www.ijs.si/ijsw/Koledar_prireditev, the previous recorded lectures
can be found on website:  <http://videolectures.net/kolokviji_ijs>
http://videolectures.net/kolokviji_ijs. 

********************************************
dr. Alexandre Gloter  

CNRS - University of Orsay, France

 

Transmission electron microscopy for nanomaterial characterization, how far
can we go?

In a first part, I will briefly survey how a magnetic field can be used in
order to focus an electron beam and then how a transmission electron
microscope works. Recent experimental developments such as the correction of
the spherical aberration of electron lenses and the resulting atomic
resolution will be showed. I will then present how this techniques are now
widely used in the order to solve various problematics such as the imaging
of nanostructures (from the industrial oriented characterisation of
multilayers to the imaging of nanoparticles into organic matter) or the
structural refinement of crystalline or defective systems (such as bonding
at interfaces or the topological description of defects in functionalised
nanotubes). Finally I will discuss how combining electron spectroscopy and
microscopy, physical or chemical properties such as the oxidation state of
transition metal oxide nanoparticles or the plasmonic properties of metallic
clusters can be investigated.

The lecture will be given in English.

 

We look forward to meeting you at the "Kolokvij na IJS"!

 

 

 

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