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</o:shapelayout></xml><![endif]--></head><body lang=SL link=blue vlink=purple><div class=WordSection1><p class=MsoNormal>Vabimo vas na 4. predavanje iz sklopa "Kolokviji na IJS" v letu 2013/14, ki bo <strong><span style='color:red'>v sredo, 27. novembra 2013, ob 13. uri </span></strong><span style='color:red'>v Veliki predavalnici Instituta »Jožef Stefan«</span> na Jamovi cesti 39 v Ljubljani. Napovednik predavanja najdete tudi na naslovu <a href="http://www.ijs.si/ijsw/Koledar_prireditev">http://www.ijs.si/ijsw/Koledar_prireditev</a>, posnetke preteklih predavanj<span style='color:blue'> </span>pa na <a href="http://videolectures.net/kolokviji_ijs">http://videolectures.net/kolokviji_ijs</a>. <o:p></o:p></p><p class=MsoNormal style='margin-bottom:12.0pt'>~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~<o:p></o:p></p><p class=MsoNormal><b>prof. dr. Miran Čeh<o:p></o:p></b></p><p class=MsoNormal><i>Odsek za nanostrukturne materiale, Center za elektronsko mikroskopijo<span style='color:#1F497D'> - </span> Institut Jožef Stefan, Ljubljana, Slovenija<o:p></o:p></i></p><p class=MsoNormal><b><span style='font-size:14.0pt;mso-fareast-language:SL'><o:p> </o:p></span></b></p><p class=MsoNormal style='text-align:justify'><b><span style='font-size:14.0pt'>Vrstična presevna elektronska mikroskopija: Uporaba v vedah o materialih<o:p></o:p></span></b></p><p class=MsoNormal style='text-align:justify'><span style='font-size:11.0pt;font-family:"Arial","sans-serif"'><o:p> </o:p></span></p><p class=MsoNormal style='text-align:justify'>Na področju karakterizacije materialov na nanoskopski in atomski ravni so se v zadnjem času trdno uveljavile različne tehnike slikanja z vrstičnim presevnim elektronskim mikroskopom (scanning transmission electron microscopy, STEM), ki jih poznamo pod kraticami ADF, HAADF in ABF. Eden izmed razlogov je tudi nedavni velik napredek pri korekciji sferičnih aberacij (Cs) leč mikroskopa. Glavni princip STEM metod slikanja je v zasnovi detektorjev, ki zbirajo pretežno elektrone, sipane pod velikimi koti, s čimer se bistveno zmanjša prispevek elastično sipanih elektronov k sliki. Zato je mogoče intenziteto atomskih stolpcev povezati s kemijsko sestavo, pri STEM slikanju z obročastim detektorjem v svetlem polju pa lahko opazujemo tudi lahke elemente. V predavanju bo predstavljen pregled osnovnih načel STEM mikroskopije. Predstavili bomo rezultate kvalitativne in kvantitativne STEM analize različnih oksidnih keramičnih materialov z nanoskopsko in atomsko ločljivostjo. Prav tako bomo govorili o nekaterih izbranih rezultatih analiz z zajemanjem slik v (S)TEM s Cs korigiranim elektronskim žarkom.<i><o:p></o:p></i></p><p class=MsoNormal style='mso-margin-top-alt:auto;margin-bottom:12.0pt;text-align:justify'>Predavanje bo v angleščini.<span style='mso-fareast-language:SL'><o:p></o:p></span></p><p class=MsoNormal style='mso-margin-top-alt:auto;margin-bottom:12.0pt'><strong><span style='font-family:"Calibri","sans-serif";color:red'>Lepo vabljeni!</span></strong><strong><span style='font-weight:normal'><o:p></o:p></span></strong></p><p class=MsoNormal><span style='font-size:11.0pt;font-family:"Calibri","sans-serif";color:#1F497D'><o:p> </o:p></span></p><p class=MsoNormal><span style='font-size:11.0pt;font-family:"Calibri","sans-serif";color:#1F497D'><o:p> </o:p></span></p><p class=MsoNormal align=center style='text-align:center'><span style='font-size:11.0pt;font-family:"Calibri","sans-serif";color:black'>*****<o:p></o:p></span></p><p class=MsoNormal align=center style='text-align:center'><span style='font-size:11.0pt;font-family:"Calibri","sans-serif";color:#1F497D'><o:p> </o:p></span></p><p class=MsoNormal><span style='font-size:11.0pt;font-family:"Calibri","sans-serif";color:#1F497D'><o:p> </o:p></span></p><p class=MsoNormal><span style='color:black'>We invite you to the 4th Institute colloquium in the academic year 2013/14. The colloquium will be held <b>on Wednesday</b></span><b><span style='color:#1F497D'> </span><span style='color:black'>November 27, 2013 at 1 PM</span></b><span style='color:black'> in <b>the main Institute</b></span><b><span style='color:#1F497D'> </span><span style='color:black'>lecture hall</span></b><span style='color:black'>, Jamova 39, Ljubljana. To read the abstract click </span><span style='color:#1F497D'><a href="http://www.ijs.si/ijsw/Koledar_prireditev">http://www.ijs.si/ijsw/Koledar_prireditev</a>. </span><span style='color:black'>Past colloquia are posted on</span><span style='color:#1F497D'> <a href="http://videolectures.net/kolokviji_ijs">http://videolectures.net/kolokviji_ijs</a>.<o:p></o:p></span></p><p class=MsoNormal><span style='color:#1F497D'><o:p> </o:p></span></p><p class=MsoNormal style='margin-bottom:12.0pt'>********************************************<b><o:p></o:p></b></p><p class=MsoNormal><b>prof. dr. Miran Čeh<o:p></o:p></b></p><p class=MsoNormal><i>Nanostructured Materials, Centre for Electron Microscopy<span style='color:#1F497D'> -</span> Jožef Stefan Institute, Ljubljana, Slovenia<o:p></o:p></i></p><p class=MsoNormal><b><span style='font-size:16.0pt'><o:p> </o:p></span></b></p><p class=MsoNormal><b><span style='font-size:16.0pt'>Scanning Transmission Electron Microscopy: Applications in Materials Science</span></b><b><span style='font-size:16.0pt;mso-fareast-language:SL'><o:p></o:p></span></b></p><p class=MsoNormal><o:p> </o:p></p><p class=MsoNormal><span lang=EN-GB>Various Scanning Transmission Electron Microscopy (STEM) imaging techniques (ADF, HAADF, ABF) have become extremely useful for materials characterization at the nano- and atomic scale, particularly due to recent developments in the correction of spherical aberrations (Cs) of the (S)TEM</span><span lang=EN-GB style='font-family:Symbol'>¢</span><span lang=EN-GB>s microscope lenses. The main principle underpinning these imaging techniques is that the detectors are designed such that they mostly collect high-angle scattered electrons, thus minimizing the contribution of elastically scattered electrons to the image. As a consequence, the intensity of the atom columns can be correlated to the chemical composition, or in case of annular bright-field STEM imaging, the light elements can be observed. This lecture will present an overview on the basic principles of STEM imaging techniques. The results of qualitative and quantitative STEM imaging at the nano- and atomic scale will be presented and commented on for various oxide ceramic materials. Selected results from probe Cs-corrected (S)TEM will also be presented</span>.<o:p></o:p></p><p class=MsoNormal><span style='color:black'><o:p> </o:p></span></p></div></body></html>